PATENTS RELATED TO ELECTRON MICROSCOPY

Professor Demchick's Patent Services

Paul H. Demchick, United States Registered Patent Agent
(United States Patent and Trademark Office Registration 52,808)

PATENTS RELATED TO ELECTRON MICROSCOPY

Although it is not necessary for a patent agent to have personal experience with the specific subject matter, such personal experience has its advantages. Dr. Demchick has considerable microscopy experience including developing some new microscopy techniques. References include:
P. Demchick and A.L. Koch. 1996. The permeability of the wall fabric of Escherichia coli and Bacillus subtilis. Journal of Bacteriology. 178:768-773.
S. Woeste and P.H. Demchick. 1991. New version of the negative stain. Applied and Environmental Microbiology. 57:1858-1859.
Dr. Demchick also has taught about microscopy in various college and university courses.

Dr. Demchick is a scientist with a quarter of a century of research experience in academic, industrial and governmental settings.
If you are considering patent protection for an invention, Dr. Demchick will be glad to discuss the matter with you. There is no charge for an initial discussion.
The following sampling is to give you some sense of the types of electron microscopy related inventions which have received United States patent protection. The patent list is not exhaustive and is certainly not a substitute for a proper patent search . It should be noted that only U.S. Patents are included.
It should be noted that spelling, form and typographical errors in the original patents are preserved here.

Composite system of scanning electron microscope and focused ion beam (United States Patent 7,154,106)
Method of three-dimensional image reconstruction and transmission electron microscope (United States Patent 7,154,092)
Scanning electron microscope (United States Patent 7,154,089)
Beam guiding arrangement, imaging method, electron microscopy system and electron lithography system (United States Patent 7,135,677)
Electron microscope (United States Patent 7,126,120)
Electron microscopy cell fraction sample preparation robot (United States Patent 7,122,155)
Method of forming images in a scanning electron microscope (United States Patent 7,105,817)
Electron microscopy system and electron microscopy method (United States Patent 7,105,814)
TEM sample equipped with an identifying function, focused ion beam device for processing TEM sample, and transmission electron microscope (United States Patent 7,095,024)
Electron microscopic inspection apparatus (United States Patent 7,091,496)
Methods and systems for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles (United States Patent 7,091,485)
Method of observation by transmission electron microscopy (United States Patent 7,083,992)
Scanning electron microscope (United States Patent 7,075,078)
Method of observing a specimen using a scanning electron microscope (United States Patent 7,075,077)
Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method (United States Patent 7,067,805)
Electron microscope (United States Patent 7,064,326)
Scanning electron microscope (United States Patent 7,057,184)
Standard sample for transmission electron microscope (TEM) elemental mapping and TEM elemetal mapping method using the same (United States Patent 7,053,372)
Scanning electron microscope with measurement function (United States Patent 7,053,371)
Scanning electron microscope (United States Patent 7,049,591)
Electron microscope (United States Patent 7,041,977)
Inspection by a transmission electron microscope of a sample (United States Patent 7,038,218)
Transmission electron microscope system and method of inspecting a specimen using the same (United States Patent 7,034,299)
Photoemission electron microscopy and measuring method using the microscopy (United States Patent 7,034,295)
Method of photothermographic imaging for transmission electron microscopy (United States Patent 7,033,742)
Illuminant, and, electron beam detector, scanning electron microscope and mass spectroscope each including the same (United States Patent 7,030,388)
Method and device for observing a specimen in a field of view of an electron microscope (United States Patent 7,022,989)
Monochromator and scanning electron microscope using the same (United States Patent 7,022,983)
Method and device for observing a specimen in a field of view of an electron microscope (United States Patent 7,012,254)
Transmission electron microscope and three-dimensional observing method (United States Patent 7,012,253)
Scanning electron microscope (United States Patent 7,009,178)
Sample-stand for scanning electron microscope (United States Patent 7,005,652)
Sample preparation for transmission electron microscopy (United States Patent 7,002,152)
Scanning electron microscope (United States Patent 7,002,151)
Scanning electron microscope (United States Patent 6,995,370)
Device and method for the examination of samples in a non-vacuum environment using a scanning electron microscope (United States Patent 6,992,300)
Apparatus and method for image optimization of samples in a scanning electron microscope (United States Patent 6,992,287)
Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope (United States Patent 6,989,542)
Structure determination of materials using electron microscopy (United States Patent 6,987,266)
Electron microscope and method for controlling focus position thereof (United States Patent 6,984,823)
Apparatus and method for secondary electron emission microscope (United States Patent 6,984,822)
Transmission electron microscope sample preparation (United States Patent 6,982,429)
Sample observation method and transmission electron microscope (United States Patent 6,982,420)
Scanning electron microscope (United States Patent 6,979,821)
Method of evaluating of a scanning electron microscope for precise measurements (United States Patent 6,969,852)
Method for the electron-microscopic observation of a semiconductor arrangement and apparatus therefor (United States Patent 6,967,328)
Scanning electron microscope and sample observing method using it (United States Patent 6,963,067)
Method of measuring the performance of a scanning electron microscope (United States Patent 6,960,764)
Energy filter and electron microscope (United States Patent 6,960,763)
Electron microscope observation system and observation method (United States Patent 6,956,212)
Testing apparatus using scanning electron microscope (United States Patent 6,953,939)
Electron microscopy system, electron microscopy method and focusing system for charged particles (United States Patent 6,949,744)
Electron microscopy system (United States Patent 6,946,657)
Collection of secondary electrons through the objective lens of a scanning electron microscope (United States Patent 6,946,654)
Twisted-compensated low-energy electron microscope (United States Patent 6,943,360)
Tip for nanoscanning electron microscope (United States Patent 6,943,356)
Vibration-isolating coupling including an elastomer diaphragm for scanning electron microscope and the like (United States Patent 6,936,826)
Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method (United States Patent 6,933,501)
Electron microscope (United States Patent 6,933,500)
Electron microscope, method for operating the same, and computer-readable medium (United States Patent 6,933,499)
Emission source having carbon nanotube, electron microscope using this emission source, and electron beam drawing device (United States Patent 6,930,313)
Electron microscope (United States Patent 6,930,306)
Site-specific method for large area uniform thickness plan view transmission electron microscopy sample preparation (United States Patent 6,927,174)
Particle-optical apparatus, electron microscopy system and electron lithography system (United States Patent 6,914,249)
Ion beam milling system and method for electron microscopy specimen preparation (United States Patent 6,914,244)
Lens for a scanning electron microscope (United States Patent 6,906,335)
Focused ion beam system with coaxial scanning electron microscope (United States Patent 6,900,447)
Scanning electron microscope (United States Patent 6,897,445)
Portable scanning electron microscope (United States Patent 6,897,443)
Scanning electron microscope (United States Patent 6,894,277)
Converting scanning electron microscopes (United States Patent 6,891,159)
Electron microscope (United States Patent 6,888,139)
Absorption current image apparatus in electron microscope (United States Patent 6,888,138)
Electron microscope and spectroscopy system (United States Patent 6,885,445)
Scanning electron microscope (United States Patent 6,885,001)
Method and apparatus for scanning semiconductor wafers using a scanning electron microscope (United States Patent 6,881,956)
Bio electron microscope and observation method of specimen (United States Patent 6,875,984)
Electron microscope and means to set observation conditions (United States Patent 6,875,983)
Electron microscope magnification standard providing precise calibration in the magnification range 5000X-2000,000X (United States Patent 6,875,982)
Sample mount for a scanning electron microscope (United States Patent 6,872,957)
Scanning electron microscope (United States Patent 6,872,944)
Method for increasing the measurement information available from a transmission electron microscope and a transmission electron microscopy device (United States Patent 6,864,483)
Electron beam detector, scanning type electron microscope, mass spectrometer, and ion detector (United States Patent 6,861,650)
Photomask and method for evaluating an initial calibration for a scanning electron microscope (United States Patent 6,861,181)
Scanning electron microscope (United States Patent 6,858,845)
Objective lens for an electron microscopy system and electron microscopy system (United States Patent 6,855,938)
Scanning electron microscope and sample observation method using the same (United States Patent 6,855,931)
Scanning electron microscope (United States Patent 6,847,038)
Wien filter and electron microscope using same (United States Patent 6,844,548)
Transmission electron microscope sample preparation (United States Patent 6,841,788)
Electron microscope (United States Patent 6,841,775)
Spherical aberration corrector for electron microscope (United States Patent 6,836,373)
Electron microscope (United States Patent 6,833,550)
Scanning electron microscope (United States Patent 6,833,546)
Method and apparatus for scanning transmission electron microscopy (United States Patent 6,822,233)
Raster electron microscope (United States Patent 6,815,678)
Scanning electron microscope and method of controlling the same (United States Patent 6,815,677)
Environmental scanning electron microscope (United States Patent 6,809,322)
Scintillator for electron microscope and method of making (United States Patent 6,803,583)
Scanning electron microscope (United States Patent 6,803,573)
Composite system of scanning electron microscope and focused ion beam (United States Patent 7,154,106)
Method of three-dimensional image reconstruction and transmission electron microscope (United States Patent 7,154,092)
Scanning electron microscope (United States Patent 7,154,089)
Beam guiding arrangement, imaging method, electron microscopy system and electron lithography system (United States Patent 7,135,677)
Electron microscope (United States Patent 7,126,120)
Electron microscopy cell fraction sample preparation robot (United States Patent 7,122,155)
Method of forming images in a scanning electron microscope (United States Patent 7,105,817)
Electron microscopy system and electron microscopy method (United States Patent 7,105,814)
TEM sample equipped with an identifying function, focused ion beam device for processing TEM sample, and transmission electron microscope (United States Patent 7,095,024)
Electron microscopic inspection apparatus (United States Patent 7,091,496)
Methods and systems for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles (United States Patent 7,091,485)
Method of observation by transmission electron microscopy (United States Patent 7,083,992)
Scanning electron microscope (United States Patent 7,075,078)
Method of observing a specimen using a scanning electron microscope (United States Patent 7,075,077)
Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method (United States Patent 7,067,805)
Electron microscope (United States Patent 7,064,326)
Scanning electron microscope (United States Patent 7,057,184)
Standard sample for transmission electron microscope (TEM) elemental mapping and TEM elemetal mapping method using the same (United States Patent 7,053,372)
Scanning electron microscope with measurement function (United States Patent 7,053,371)
Scanning electron microscope (United States Patent 7,049,591)
Electron microscope (United States Patent 7,041,977)
Inspection by a transmission electron microscope of a sample (United States Patent 7,038,218)
Transmission electron microscope system and method of inspecting a specimen using the same (United States Patent 7,034,299)
Photoemission electron microscopy and measuring method using the microscopy (United States Patent 7,034,295)
Method of photothermographic imaging for transmission electron microscopy (United States Patent 7,033,742)
Illuminant, and, electron beam detector, scanning electron microscope and mass spectroscope each including the same (United States Patent 7,030,388)
Method and device for observing a specimen in a field of view of an electron microscope (United States Patent 7,022,989)
Monochromator and scanning electron microscope using the same (United States Patent 7,022,983)
Method and device for observing a specimen in a field of view of an electron microscope (United States Patent 7,012,254)
Transmission electron microscope and three-dimensional observing method (United States Patent 7,012,253)
Scanning electron microscope (United States Patent 7,009,178)
Sample-stand for scanning electron microscope (United States Patent 7,005,652)
Sample preparation for transmission electron microscopy (United States Patent 7,002,152)
Scanning electron microscope (United States Patent 7,002,151)
Scanning electron microscope (United States Patent 6,995,370)
Device and method for the examination of samples in a non-vacuum environment using a scanning electron microscope (United States Patent 6,992,300)
Apparatus and method for image optimization of samples in a scanning electron microscope (United States Patent 6,992,287)
Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope (United States Patent 6,989,542)
Structure determination of materials using electron microscopy (United States Patent 6,987,266)
Electron microscope and method for controlling focus position thereof (United States Patent 6,984,823)
Apparatus and method for secondary electron emission microscope (United States Patent 6,984,822)
Transmission electron microscope sample preparation (United States Patent 6,982,429)
Sample observation method and transmission electron microscope (United States Patent 6,982,420)
Scanning electron microscope (United States Patent 6,979,821)
Method of evaluating of a scanning electron microscope for precise measurements (United States Patent 6,969,852)
Method for the electron-microscopic observation of a semiconductor arrangement and apparatus therefor (United States Patent 6,967,328)
Scanning electron microscope and sample observing method using it (United States Patent 6,963,067)
Method of measuring the performance of a scanning electron microscope (United States Patent 6,960,764)
Energy filter and electron microscope (United States Patent 6,960,763)
Electron microscope observation system and observation method (United States Patent 6,956,212)
Testing apparatus using scanning electron microscope (United States Patent 6,953,939)
Electron microscopy system, electron microscopy method and focusing system for charged particles (United States Patent 6,949,744)
Electron microscopy system (United States Patent 6,946,657)
Collection of secondary electrons through the objective lens of a scanning electron microscope (United States Patent 6,946,654)
Twisted-compensated low-energy electron microscope (United States Patent 6,943,360)
Tip for nanoscanning electron microscope (United States Patent 6,943,356)
Vibration-isolating coupling including an elastomer diaphragm for scanning electron microscope and the like (United States Patent 6,936,826)
Ultimate analyzer, scanning transmission electron microscope and ultimate analysis method (United States Patent 6,933,501)
Electron microscope (United States Patent 6,933,500)
Electron microscope, method for operating the same, and computer-readable medium (United States Patent 6,933,499)
Emission source having carbon nanotube, electron microscope using this emission source, and electron beam drawing device (United States Patent 6,930,313)
Electron microscope (United States Patent 6,930,306)
Site-specific method for large area uniform thickness plan view transmission electron microscopy sample preparation (United States Patent 6,927,174)
Particle-optical apparatus, electron microscopy system and electron lithography system (United States Patent 6,914,249)
Ion beam milling system and method for electron microscopy specimen preparation (United States Patent 6,914,244)
Lens for a scanning electron microscope (United States Patent 6,906,335)
Focused ion beam system with coaxial scanning electron microscope (United States Patent 6,900,447)
Scanning electron microscope (United States Patent 6,897,445)
Portable scanning electron microscope (United States Patent 6,897,443)
Scanning electron microscope (United States Patent 6,894,277)
Converting scanning electron microscopes (United States Patent 6,891,159)
Electron microscope (United States Patent 6,888,139)
Absorption current image apparatus in electron microscope (United States Patent 6,888,138)
Electron microscope and spectroscopy system (United States Patent 6,885,445)
Scanning electron microscope (United States Patent 6,885,001)
Method and apparatus for scanning semiconductor wafers using a scanning electron microscope (United States Patent 6,881,956)
Bio electron microscope and observation method of specimen (United States Patent 6,875,984)
Electron microscope and means to set observation conditions (United States Patent 6,875,983)
Electron microscope magnification standard providing precise calibration in the magnification range 5000X-2000,000X (United States Patent 6,875,982)
Sample mount for a scanning electron microscope (United States Patent 6,872,957)
Scanning electron microscope (United States Patent 6,872,944)
Method for increasing the measurement information available from a transmission electron microscope and a transmission electron microscopy device (United States Patent 6,864,483)
Electron beam detector, scanning type electron microscope, mass spectrometer, and ion detector (United States Patent 6,861,650)
Photomask and method for evaluating an initial calibration for a scanning electron microscope (United States Patent 6,861,181)
Scanning electron microscope (United States Patent 6,858,845)
Objective lens for an electron microscopy system and electron microscopy system (United States Patent 6,855,938)
Scanning electron microscope and sample observation method using the same (United States Patent 6,855,931)
Scanning electron microscope (United States Patent 6,847,038)
Wien filter and electron microscope using same (United States Patent 6,844,548)
Transmission electron microscope sample preparation (United States Patent 6,841,788)
Electron microscope (United States Patent 6,841,775)
Spherical aberration corrector for electron microscope (United States Patent 6,836,373)
Electron microscope (United States Patent 6,833,550)
Scanning electron microscope (United States Patent 6,833,546)
Method and apparatus for scanning transmission electron microscopy (United States Patent 6,822,233)
Raster electron microscope (United States Patent 6,815,678)
Scanning electron microscope and method of controlling the same (United States Patent 6,815,677)
Environmental scanning electron microscope (United States Patent 6,809,322)
Scintillator for electron microscope and method of making (United States Patent 6,803,583)
Scanning electron microscope (United States Patent 6,803,573)

Although his recognition as a registered patent agent permits him to represent others in all patent matters before the United States Patent and Trademark Office, Dr. Demchick limits his practice to patent matters involving inventions for which he is confident that his expertise will allow him to serve his client well. He will gladly discuss whether he is comfortable handling cases involving inventions in a particular field. He will err on the side of declining cases if he has uncertainty about his ability to do what is needed in the case. Dr. Demchick does not represent clients in court. However, he refers clients to a patent attorney who does represent others in court, if it appears likely that patent related representation in court is appropriate. Dr. Demchick prepares and files non-provisional (regular) patent applications and provisional patent applications. He prepares and files utility patent applications and design patent applications. He prepares and files U.S. patent applications and international patent applications under the Patent Cooperation Treaty (PCT). He prepares and files applications to enter the U.S. National Phase for inventions for which international patent applications (PCT) were already filed. One of the matters he discusses with each client or potential client is which type of application(s) best meets that client's needs. He usually does a patent search (patentability search) as part of the preparation of a patent application. He discusses the value of patent searching with each inventor before agreeing to prepare a patent application for that inventor.