Professor Demchick's Patent Services
Paul H. Demchick, United States Registered Patent Agent
(United States Patent and Trademark Office Registration 52,808)
Professor Demchick's Patent Services
Paul H. Demchick, United States Registered Patent Agent
(United States Patent and Trademark Office Registration 52,808)
PATENTS RELATED TO MICROSCOPY Although it is not necessary for a patent agent to have personal experience with the specific subject matter, such personal experience has its advantages. Dr. Demchick has considerable microscopy experience including developing some new microscopy techniques. References include:
Dr. Demchick also has taught about microscopy in various college and university courses.P. Demchick and A.L. Koch. 1996. The permeability of the wall fabric of Escherichia coli and Bacillus subtilis. Journal of Bacteriology. 178:768-773.
S. Woeste and P.H. Demchick. 1991. New version of the negative stain. Applied and Environmental Microbiology. 57:1858-1859.
Dr. Demchick is a scientist with a quarter of a century of research experience in academic, industrial and governmental settings.
If you are considering patent protection for an invention, Dr. Demchick will be glad to discuss the matter with you. There is no charge for an initial discussion.
The following sampling is to give you some sense of the types of microscopy related inventions which have received United States patent protection. The patent list is not exhaustive and is certainly not a substitute for a proper patent search . It should be noted that only U.S. Patents are included.
It should be noted that spelling, form and typographical errors in the original patents are preserved here.
System for creating microscopic digital montage images (United States Patent 7,155,049)
Composite system of scanning electron microscope and focused ion beam (United States Patent 7,154,106)
Method of three-dimensional image reconstruction and transmission electron microscope (United States Patent 7,154,092)
Method and system for ultrafast photoelectron microscope (United States Patent 7,154,091)
Scanning electron microscope (United States Patent 7,154,089)
Optical-scanning microscope apparatus (United States Patent 7,154,084)
Topography and recognition imaging atomic force microscope and method of operation (United States Patent 7,152,462)
Arrangement for tilting an illumination carrier on an inverse light microscope (United States Patent 7,151,634)
Scanning microscope (United States Patent 7,151,633)
Method for classifying object image regions of an object to be detected using a scanning microscope (United States Patent 7,151,270)
Vertically aligned nanostructure scanning probe microscope tips (United States Patent 7,151,256)
Method and apparatus for calibration of near-field scanning optical microscope tips for laser machining (United States Patent 7,151,244)
Method and apparatus for internet, intranet, and local viewing of virtual microscope slides (United States Patent 7,149,332)
Method and apparatus for creating a virtual microscope slide (United States Patent 7,146,372)
Microscope with position detection of changers of optical components (United States Patent 7,145,652)
Scanning magnetic microscope having improved magnetic sensor (United States Patent 7,145,330)
Microscopic batteries integrated with MEMS systems (United States Patent 7,144,654)
Lighting device for a microscope (United States Patent 7,142,359)
Gem microscope with portability kit (United States Patent 7,142,358)
Microscopy (United States Patent 7,142,308)
System and method for calibrating position of microscope slide within storage receptacle (United States Patent 7,140,738)
Robotic microscopy systems (United States Patent 7,139,415)
Information recording medium having substrate with microscopic pattern and reproducing apparatus therefor (United States Patent 7,139,236)
Projection microscope (United States Patent 7,139,121)
Ultra-fast temperature switch for microscopic samples (United States Patent 7,139,070)
Multi-dimensional force sensing for scanning probe microscopy using carbon nanotube tips and carbon nanotube oscillators (United States Patent 7,137,291)
Control system, control apparatus, and control method for microscope stage (United States Patent 7,136,708)
Stereoscopic microscope objective (United States Patent 7,136,229)
Ergonomic microscope and microscope carrier (United States Patent 7,136,222)
Microscope with a handle and/or hand-grip for a microscope (United States Patent 7,136,221)
Beam guiding arrangement, imaging method, electron microscopy system and electron lithography system (United States Patent 7,135,677)
Method for forming microscopic polymer interconnections (United States Patent 7,135,134)
Method for quantitative video-microscopy and associated system and computer software program product (United States Patent 7,133,547)
Recording medium having a substrate containing microscopic pattern of parallel groove and land sections and recording/reproducing equipment therefor (United States Patent 7,133,331)
Liquid immersion microscope objective (United States Patent 7,133,212)
Longitudinal differential interferometric confocal microscopy (United States Patent 7,133,139)
Method for scanning microscopy, scanning microscope, and apparatus for coding an illuminating light beam (United States Patent 7,133,130)
Near-field scanning microwave microscope using dielectric resonator (United States Patent 7,130,755)
Microscope apparatus (United States Patent 7,130,117)
Microscope apparatus having an objective displacement detection system (United States Patent 7,130,116)
Laser scanning microscope and indicator discriminating method (United States Patent 7,130,043)
Dual axis fluorescence microscope with modulated input (United States Patent 7,130,042)
Contrast enhancing solution for use in confocal microscopy (United States Patent 7,128,894)
Stand for a surgical microscope (United States Patent 7,128,300)
Digital interference holographic microscope and methods (United States Patent 7,127,109)
Illumination apparatus for microscope and image processing apparatus using the same (United States Patent 7,126,752)
Anti-reflection film and microscope having optical element with the same anti-reflection film applied thereto (United States Patent 7,126,751)
Spectroscope confocal optical system using the same, and scanning microscope (United States Patent 7,126,684)
Electron microscope (United States Patent 7,126,120)
Arrangement for examining microscopic preparations with a scanning microscope, and illumination device for a scanning microscope (United States Patent 7,123,408)
Acoustic imaging microscope (United States Patent 7,123,364)
Near infrared chemical imaging microscope (United States Patent 7,123,360)
Electron microscopy cell fraction sample preparation robot (United States Patent 7,122,155)
Method; microscope system and software program for the observation of dynamic processes (United States Patent 7,120,281)
Phase contrast microscope for short wavelength radiation and imaging method (United States Patent 7,119,953)
Method of fabricating probe for scanning probe microscope (United States Patent 7,119,332)
Control system for microscopes (United States Patent 7,119,315)
Near-field intra-cellular apertureless microscope (United States Patent 7,116,475)
In vitro fertilization microscope (United States Patent 7,116,474)
Methods, systems and computer program products for calibration of microscopy imaging devices (United States Patent 7,115,848)
Probe mounting device for a scanning probe microscope (United States Patent 7,114,405)
Multi-spectral miniature microscope array (United States Patent 7,113,651)
Microscope apparatus (United States Patent 7,113,330)
Atomic force microscope (United States Patent 7,111,504)
Method and instrument for microscopy (United States Patent 7,110,645)
Apparatus for remote control of a microscope (United States Patent 7,110,586)
Microscopy system and method (United States Patent 7,110,173)
Microscope and sample observation method (United States Patent 7,110,172)
Integrated EWP-STM spin resonance microscope (United States Patent 7,109,706)
Auto-focusing method and device for use with optical microscopy (United States Patent 7,109,459)
Enhanced shutter control for images that are faded into a stereo microscope (United States Patent 7,106,504)
High-resolution optical microscope (United States Patent 7,106,503)
Operation of a Cartesian robotic system in a compact microscope imaging system with intelligent controls (United States Patent 7,106,502)
High frequency scanning SQUID microscope and method of measuring high frequency magnetic fields (United States Patent 7,106,057)
Method of forming images in a scanning electron microscope (United States Patent 7,105,817)
Electron microscopy system and electron microscopy method (United States Patent 7,105,814)
Microscope having a system for reflecting in illumination (United States Patent 7,102,818)
Objective lens device for a microscope (United States Patent 7,102,817)
Arrangement for the manual adjustment of a focus position on microscopes (United States Patent 7,102,816)
Optical microscope system and optical axis correcting method (United States Patent 7,102,815)
Scanning probe microscopy system and method of measurement by the same (United States Patent 7,098,453)
Light source for the illumination of microscopic specimens and scanning microscope system (United States Patent 7,098,447)
Methods of fabricating structures for characterizing tip shape of scanning probe microscope probes and structures fabricated thereby (United States Patent 7,096,711)
Microscope with wavelength compensation (United States Patent 7,095,556)
Method and apparatus using microscopic and interferometric based detection (United States Patent 7,095,507)
Focusing of microscopes and reading of microarrays (United States Patent 7,095,032)
TEM sample equipped with an identifying function, focused ion beam device for processing TEM sample, and transmission electron microscope (United States Patent 7,095,024)
Sensing mode atomic force microscope (United States Patent 7,095,020)
Scanning probe microscopy apparatus and techniques (United States Patent 7,093,509)
Apparatus for microscopic observation of long-term culture of single cell (United States Patent 7,092,154)
Temperature-controlled gas microscope (United States Patent 7,092,153)
Optical device for releasable attachment to a microscope (United States Patent 7,092,152)
Microscope having a pipette device (United States Patent 7,092,151)
Cars microscope and method for cars microscopy (United States Patent 7,092,086)
Method of guided blind deconvolution of microscopic images and software (United States Patent 7,091,990)
Electron microscopic inspection apparatus (United States Patent 7,091,496)
Methods and systems for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles (United States Patent 7,091,485)
Scanning probe microscope assembly (United States Patent 7,091,476)
Torsional harmonic cantilevers for detection of high frequency force components in atomic force microscopy (United States Patent 7,089,787)
Beam splitter device or laser-scanning microscope (United States Patent 7,088,517)
System for creating microscopic digital montage images (United States Patent 7,155,049)
Composite system of scanning electron microscope and focused ion beam (United States Patent 7,154,106)
Method of three-dimensional image reconstruction and transmission electron microscope (United States Patent 7,154,092)
Method and system for ultrafast photoelectron microscope (United States Patent 7,154,091)
Scanning electron microscope (United States Patent 7,154,089)
Optical-scanning microscope apparatus (United States Patent 7,154,084)
Topography and recognition imaging atomic force microscope and method of operation (United States Patent 7,152,462)
Arrangement for tilting an illumination carrier on an inverse light microscope (United States Patent 7,151,634)
Scanning microscope (United States Patent 7,151,633)
Method for classifying object image regions of an object to be detected using a scanning microscope (United States Patent 7,151,270)
Vertically aligned nanostructure scanning probe microscope tips (United States Patent 7,151,256)
Method and apparatus for calibration of near-field scanning optical microscope tips for laser machining (United States Patent 7,151,244)
Method and apparatus for internet, intranet, and local viewing of virtual microscope slides (United States Patent 7,149,332)
Method and apparatus for creating a virtual microscope slide (United States Patent 7,146,372)
Microscope with position detection of changers of optical components (United States Patent 7,145,652)
Scanning magnetic microscope having improved magnetic sensor (United States Patent 7,145,330)
Microscopic batteries integrated with MEMS systems (United States Patent 7,144,654)
Lighting device for a microscope (United States Patent 7,142,359)
Gem microscope with portability kit (United States Patent 7,142,358)
Microscopy (United States Patent 7,142,308)
System and method for calibrating position of microscope slide within storage receptacle (United States Patent 7,140,738)
Robotic microscopy systems (United States Patent 7,139,415)
Information recording medium having substrate with microscopic pattern and reproducing apparatus therefor (United States Patent 7,139,236)
Projection microscope (United States Patent 7,139,121)
Ultra-fast temperature switch for microscopic samples (United States Patent 7,139,070)
Multi-dimensional force sensing for scanning probe microscopy using carbon nanotube tips and carbon nanotube oscillators (United States Patent 7,137,291)
Control system, control apparatus, and control method for microscope stage (United States Patent 7,136,708)
Stereoscopic microscope objective (United States Patent 7,136,229)
Ergonomic microscope and microscope carrier (United States Patent 7,136,222)
Microscope with a handle and/or hand-grip for a microscope (United States Patent 7,136,221)
Beam guiding arrangement, imaging method, electron microscopy system and electron lithography system (United States Patent 7,135,677)
Method for forming microscopic polymer interconnections (United States Patent 7,135,134)
Method for quantitative video-microscopy and associated system and computer software program product (United States Patent 7,133,547)
Recording medium having a substrate containing microscopic pattern of parallel groove and land sections and recording/reproducing equipment therefor (United States Patent 7,133,331)
Liquid immersion microscope objective (United States Patent 7,133,212)
Longitudinal differential interferometric confocal microscopy (United States Patent 7,133,139)
Method for scanning microscopy, scanning microscope, and apparatus for coding an illuminating light beam (United States Patent 7,133,130)
Near-field scanning microwave microscope using dielectric resonator (United States Patent 7,130,755)
Microscope apparatus (United States Patent 7,130,117)
Microscope apparatus having an objective displacement detection system (United States Patent 7,130,116)
Laser scanning microscope and indicator discriminating method (United States Patent 7,130,043)
Dual axis fluorescence microscope with modulated input (United States Patent 7,130,042)
Contrast enhancing solution for use in confocal microscopy (United States Patent 7,128,894)
Stand for a surgical microscope (United States Patent 7,128,300)
Digital interference holographic microscope and methods (United States Patent 7,127,109)
Illumination apparatus for microscope and image processing apparatus using the same (United States Patent 7,126,752)
Anti-reflection film and microscope having optical element with the same anti-reflection film applied thereto (United States Patent 7,126,751)
Spectroscope confocal optical system using the same, and scanning microscope (United States Patent 7,126,684)
Electron microscope (United States Patent 7,126,120)
Arrangement for examining microscopic preparations with a scanning microscope, and illumination device for a scanning microscope (United States Patent 7,123,408)
Acoustic imaging microscope (United States Patent 7,123,364)
Near infrared chemical imaging microscope (United States Patent 7,123,360)
Electron microscopy cell fraction sample preparation robot (United States Patent 7,122,155)
Method; microscope system and software program for the observation of dynamic processes (United States Patent 7,120,281)
Phase contrast microscope for short wavelength radiation and imaging method (United States Patent 7,119,953)
Method of fabricating probe for scanning probe microscope (United States Patent 7,119,332)
Control system for microscopes (United States Patent 7,119,315)
Near-field intra-cellular apertureless microscope (United States Patent 7,116,475)
In vitro fertilization microscope (United States Patent 7,116,474)
Methods, systems and computer program products for calibration of microscopy imaging devices (United States Patent 7,115,848)
Probe mounting device for a scanning probe microscope (United States Patent 7,114,405)
Multi-spectral miniature microscope array (United States Patent 7,113,651)
Microscope apparatus (United States Patent 7,113,330)
Atomic force microscope (United States Patent 7,111,504)
Method and instrument for microscopy (United States Patent 7,110,645)
Apparatus for remote control of a microscope (United States Patent 7,110,586)
Microscopy system and method (United States Patent 7,110,173)
Microscope and sample observation method (United States Patent 7,110,172)
Integrated EWP-STM spin resonance microscope (United States Patent 7,109,706)
Auto-focusing method and device for use with optical microscopy (United States Patent 7,109,459)
Enhanced shutter control for images that are faded into a stereo microscope (United States Patent 7,106,504)
High-resolution optical microscope (United States Patent 7,106,503)
Operation of a Cartesian robotic system in a compact microscope imaging system with intelligent controls (United States Patent 7,106,502)
High frequency scanning SQUID microscope and method of measuring high frequency magnetic fields (United States Patent 7,106,057)
Method of forming images in a scanning electron microscope (United States Patent 7,105,817)
Electron microscopy system and electron microscopy method (United States Patent 7,105,814)
Microscope having a system for reflecting in illumination (United States Patent 7,102,818)
Objective lens device for a microscope (United States Patent 7,102,817)
Arrangement for the manual adjustment of a focus position on microscopes (United States Patent 7,102,816)
Optical microscope system and optical axis correcting method (United States Patent 7,102,815)
Scanning probe microscopy system and method of measurement by the same (United States Patent 7,098,453)
Light source for the illumination of microscopic specimens and scanning microscope system (United States Patent 7,098,447)
Methods of fabricating structures for characterizing tip shape of scanning probe microscope probes and structures fabricated thereby (United States Patent 7,096,711)
Microscope with wavelength compensation (United States Patent 7,095,556)
Method and apparatus using microscopic and interferometric based detection (United States Patent 7,095,507)
Focusing of microscopes and reading of microarrays (United States Patent 7,095,032)
TEM sample equipped with an identifying function, focused ion beam device for processing TEM sample, and transmission electron microscope (United States Patent 7,095,024)
Sensing mode atomic force microscope (United States Patent 7,095,020)
Scanning probe microscopy apparatus and techniques (United States Patent 7,093,509)
Apparatus for microscopic observation of long-term culture of single cell (United States Patent 7,092,154)
Temperature-controlled gas microscope (United States Patent 7,092,153)
Optical device for releasable attachment to a microscope (United States Patent 7,092,152)
Microscope having a pipette device (United States Patent 7,092,151)
Cars microscope and method for cars microscopy (United States Patent 7,092,086)
Method of guided blind deconvolution of microscopic images and software (United States Patent 7,091,990)
Electron microscopic inspection apparatus (United States Patent 7,091,496)
Methods and systems for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles (United States Patent 7,091,485)
Scanning probe microscope assembly (United States Patent 7,091,476)
Torsional harmonic cantilevers for detection of high frequency force components in atomic force microscopy (United States Patent 7,089,787)
Beam splitter device or laser-scanning microscope (United States Patent 7,088,517)
Although his recognition as a registered patent agent permits him to represent others in all patent matters before the United States Patent and Trademark Office, Dr. Demchick limits his practice to patent matters involving inventions for which he is confident that his expertise will allow him to serve his client well. He will gladly discuss whether he is comfortable handling cases involving inventions in a particular field. He will err on the side of declining cases if he has uncertainty about his ability to do what is needed in the case. Dr. Demchick does not represent clients in court. However, he refers clients to a patent attorney who does represent others in court, if it appears likely that patent related representation in court is appropriate. Dr. Demchick prepares and files non-provisional (regular) patent applications and provisional patent applications. He prepares and files utility patent applications and design patent applications. He prepares and files U.S. patent applications and international patent applications under the Patent Cooperation Treaty (PCT). He prepares and files applications to enter the U.S. National Phase for inventions for which international patent applications (PCT) were already filed. One of the matters he discusses with each client or potential client is which type of application(s) best meets that client's needs. He usually does a patent search (patentability search) as part of the preparation of a patent application. He discusses the value of patent searching with each inventor before agreeing to prepare a patent application for that inventor.